Digital Integrated Circuit (IC) Testing

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Digital Integrated Circuit (IC) Testing

Overview

Course Date:
TBA
Registration Period:
TBA
Duration/Frequency:
8 hours
Mode of Training:
Facilitated Learning (F2F) and Practical Training
Venue:
Singapore Polytechnic
Funding:
Eligible for SkillsFuture Credit

This course would equip participants with essential knowledge of integrated circuit (IC) testing and developing test program for digital IC testing on a System on Chip (SoC) tester integrated with handler widely used in Integrated Device Manufacturing (IDMs) and foundries.

Course Objective

This course covers participants with the essential knowledge and skills in digital integrated circuit testing. Participants will be introduced to the various types of IC technologies, packaging and fundamentals of integrated circuit (IC) test methodologies.

Participants will understand the various aspects of IC test such as Direct Current (DC), Alternating Current (AC) parametric and functional tests and developing a test program for digital testing on a System on Chip (SoC) tester integrated with a handler widely used in the Integrated Device Manufacturing (IDMs) and foundries

Course Outline

By the end of the course, participants will be able to:
1. Describe the Integrated Circuit (IC) manufacturing cycle
2. Interpret the different types of IC technologies and packaging
3. Explain the application of automatic test system in Wafer Test, QA Test, Reliability Test, Burn-in and Characterization Test.
4. Explain the different IC test methodologies; DC, AC and functional tests
5. Describe the architecture of a SoC tester
6. Develop test program for a digital IC to perform DC, AC and functional test.
7. Test and debug on an industrial SoC tester with handler

Topics to be covered

1. Overview of IC manufacturing cycle and IC testing.
Different types of IC technologies and IC packaging.
Application of Automatic Test System in the following areas: wafer test, final test, QA test, reliability test, burn-in and characterization test.
Outline the evolution of ATS and its future trends.
2. General concepts of digital test methodologies:
DC test, AC test and Functional test.
Need of temperature testing.
Overview of IC datasheet.
3. Architecture of a SoC Test System
Introduction to pattern generator, timing, source & measurement unit and waveform in a test system.
4. Develop test program for digital IC to perform DC, AC and functional test on a SoC tester.
Testing and debugging on a SoC tester.
5. Overview and Demonstration of test cell process.

Minimum Requirements

ITE qualifications and above.

Certification / Accreditation

• Certificate of Attendance (electronic Certificate will be issued)
A Certificate of Attendance will be awarded to participants who meet at least 75% attendance rate

• Certificate of Completion (electronic Certificate will be issued)
A Certificate of Completion will be awarded to participants who pass the assessment and meet at least 75% attendance rate

Suitable for

All engineering technical or personnel targeted to Electronics Skills framework; Test Associate Engineer / Product Associate Engineer / Associate Quality Engineer / Equipment Associate Engineer

Course Fees

For more information on course fee / or to apply, click on the “Register” button.

Applicants/Eligibility	SkillsFuture Funding	GST*	Subsidised Fee (after GST)
Singapore Citizens aged 40 and above¹	$729.00	$21.87	$102.87
Singapore Citizens aged below 40	$567.00	$21.87	$264.87
Singapore Permanent Residents and LTVP+ Holders	$567.00	$21.87	$264.87
SME-sponsored Singapore Citizens, Permanent Residents and LTVP+ Holders²	$729.00	$21.87	$102.87
Others (Full fees payable)	$0.00	$72.90	$882.90